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  .: DTIS General Scope  

 

Integrated System Design :

SOC, SIP design
Multiprocessor systems
Embedded systems
Wireless systems
Network on Chip
Analog, Mixed Signal and RF systems
MEMS and MOEMS systems
Low Voltage and Low Power systems
Innovative technologies
Synthesis (physical, logic,...)
Simulation, Validation and Verification

Integrated System Technology :

Nanoelectronics
Device modeling
Material characterization
Failure analysis
New components
Packaging
Process technology
Reliability issues

Integrated System Testing :

Defect and fault modelling
Analog and Mixed Signal testing
MEMS/MOEMS testing
SOC and SIP testing
Delay testing
Memory testing
Fault Simulation, ATPG
DFT, BIST and BISR
On-line testing and fault tolerant systems
ATE issues
Alternative test strategies

 

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:: IEEE DTIS Conference Chairs:
Dr. Mohamed Masmoudi
ENIS - Tunisia

Dr. Michel Renovell
LIRMM - France

:: Committees :
.: Organizing Committee
.: Technical Committees
.: Steering Committee
:: Sponsors & Partners :

.: Technical Sponsors
.: Industrial Sponsors
.: Partners


Preliminary Program

Keynote Speakers

 

 

 

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