GENERAL SCOPE
Integrated System Design :
SOC, SIP design
Multiprocessor systems
Embedded systems
Wireless systems
Network on Chip
Analog, Mixed Signal and RF systems
Digital Design Automation Technics
MEMS and MOEMS systems
Low Voltage and Low Power systems
Innovative technologies
Synthesis (physical, logic,...)Â
Simulation, Validation and Verification
3D-Design
Integrated System Technology :Â
NanoelectronicsÂ
Device modelingÂ
Material characterizationÂ
Failure analysisÂ
New componentsÂ
PackagingÂ
Process technologyÂ
Reliability issues
3D stacked IC Technology
Integrated System Testing :Â
Defect and fault modellingÂ
Analog and Mixed Signal testingÂ
MEMS/MOEMS testing
SOC and SIP testingÂ
Delay testingÂ
Memory testingÂ
Fault Simulation, ATPGÂ
DFT, BIST and BISRÂ
On-line testing and fault tolerant systemsÂ
ATE issuesÂ
Alternative test strategiesÂ
3D-test
